PVMC c-Si Metrology Workshop Materials for Download

July 12, 2012

Metrology is a critical element in both manufacturing and technology development. Improvements in metrology for crystalline silicon (c-Si) photovoltaics (PV) have played an important role in increasing efficiency and driving down production costs. Moving forward, there are wide range of challenges and opportunities associated with c-Si PV metrology.

Title Presenter Company
PVMC Overview W. Schoenfeld USPVMC
Unified Lifetime Measurement for Silicon PV L. Jastrzebski Semilab SDI
Carrier-Lifetime Testing to Monitor Material Quality through Silicon Solar Cell Manufacturing J. Swirhun Sinton Instruments, Inc.
Efficiency & Yield Improvements with Factory-Wide Process Control Software D. Genova Rudolph Technologies
Solar Simulation for Advanced Module Manufacturing M. Stein Spire Solar
High-Speed Quantum Efficiency Measurements in Research and Manufacturing G. Horner Tau Science
Spectroscopic Ellipsometry (SE) in Photovoltaic Applications J. Sun J.A. Woollam Co., Inc.
X-ray Diffraction Imaging for Prediction of the Propagation Probability of Individual Cracks in Brittle Single Crystal Materials P. Ryan Jordan Valley
U.S. PVMC Report c-Si Metrology Workshop at Intersolar North America 2012 K. Davis USPVMC